Products used X-ray inspection system with nano- and micro-multi-focus open-tube X-ray source. MUX‒3400/MUX‒3410 Equipped with a tilting CT method for CT of plate-like objects such as printed circuit boards, wafers and system LSIs (MUX-3410). Product Information
X-ray inspection system with nano- and micro-multi-focus open-tube X-ray source. MUX‒3400/MUX‒3410 Equipped with a tilting CT method for CT of plate-like objects such as printed circuit boards, wafers and system LSIs (MUX-3410). Product Information